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. 2003 Dec;77(23):12881–12885. doi: 10.1128/JVI.77.23.12881-12885.2003

FIG. 2.

FIG. 2.

AFM of rAd and eAd. The silicon substrate surface with intact native oxide was prepared by UV cleaning, rinsing with distilled H2O (dH2O), and drying under a filtered-nitrogen stream. Approximately 15 μl of solution of 1011 Ad particles/ml was deposited on the above surface, and viruses were allowed to adsorb for 15 min. Unbound viruses were removed by washing with dH2O and then dried under a nitrogen stream. Imaging was performed in air with a ThermoMicroscopes Explorer (Veeco/TM, Sunnyvale, Calif.) with a 100-μm tripod air scanner calibrated with a NT-MDT calibration grid. Silicon tips (Nanosensors FESP; Digital Instruments, Santa Barbara, Calif.) with spring constant of ∼2 N/m and resonance frequency of ∼70 kHz were used for imaging in intermittent-contact mode. (A) rAd; (B) empty particles.